Title :
3D inspection of electronic devices by means of stereo method on single camera environment
Author :
Kusano, Akira ; Watanabe, Takashi ; Funahashi, Takuma ; Fujiwara, Takayuki ; Koshimizu, Hiroyasu
Author_Institution :
Sch. of Inf. Sci. & Technol., Chukyo Univ.
Abstract :
It is very important to guarantee the quality of the industrial products by means of visual inspection. In order to reduce the soldering defect with terminal deformation and terminal burr in the manufacturing process, this paper proposes a 3D visual inspection system based on a stereo vision with single camera. It is technically noted that the base line of this single camera stereo was precisely calibrated by the image processing procedure. Also to extract the measuring point coordinates for computing disparity; the error is reduced with original algorithm. Comparing its performance with that of human inspection using industrial microscope, the proposed 3D inspection could be an alternative in precision and in processing cost. Since the practical specification in 3D precision is less than 1 pixel and the experimental performance was around the same, it was demonstrated by the proposed system that the soldering defect with terminal deformation and terminal burr in inspection, especially in 3D inspection, was decreased. In order to realize the inline inspection, this paper will suggest how the human inspection of the products could be modeled and be implemented by the computer system especially in manufacturing process.
Keywords :
cameras; electronic products; flaw detection; inspection; quality control; soldering; stereo image processing; 3D visual inspection system; electronic devices; image processing procedure; industrial products; manufacturing process; quality control; single camera environment; soldering defect reduction; stereo vision method; terminal burr; terminal deformation; Cameras; Coordinate measuring machines; Humans; Image processing; Inspection; Manufacturing industries; Manufacturing processes; Microscopy; Soldering; Stereo vision;
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2008.4758505