Title :
Five-parameter model of photovoltaic cell based on STC data and dimensionless
Author :
Lineykin, Simon ; Averbukh, Moshe ; Kuperman, Alon
Author_Institution :
Dept. of Mech. Eng. & Mechatron., Ariel Univ. Center of Samaria, Ariel, Israel
Abstract :
This paper offers a novel approach of the “singlediode” equivalent circuit model estimation, which is based on analysis of the characteristics of the solar panel supplied by the manufacturer. The method combines solution of a system of algebraic equations with optimization algorithm for extracting the seven photovoltaic module parameters of the single diode lumped circuit model. These parameters are the photocurrent, the reverse bias saturation current, the ideality factor, the series resistance, the shunt resistance, the bandgap energy, and the temperature coefficient of the photo-generating current. A minimal set of experimental data is required for parameter extraction. In many cases, the required parameters can be extracted directly from the manufacturer´s data. The number of solar panels of different types of manufacturers were analyzed. All the models have been obtained from the manufacturer´s data only. The precision of simulation results is about 0.1%-0.5% for STC.
Keywords :
diodes; equivalent circuits; estimation theory; lumped parameter networks; modules; optimisation; photoconductivity; photoemission; photovoltaic cells; photovoltaic power systems; solar cells; STC data; algebraic equation; bandgap energy; five-parameter model; ideality factor; optimization algorithm; photocurrent parameter; photogenerating current; photovoltaic cell; photovoltaic module parameter extraction; reverse bias saturation current; series resistance; shunt resistance; single diode lumped circuit model; single-diode equivalent circuit model estimation; solar panel characteristics; temperature coefficient; Computational modeling; Equations; Equivalent circuits; Integrated circuit modeling; Mathematical model; Photovoltaic cells; Photovoltaic systems;
Conference_Titel :
Electrical & Electronics Engineers in Israel (IEEEI), 2012 IEEE 27th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4673-4682-5
DOI :
10.1109/EEEI.2012.6377079