Title :
Advanced technique for broadband on-wafer rf device characterization
Author :
Scholz, Rene F. ; Korndörfer, Falk ; Senapati, Biswanath ; Rumiantsev, Andrej
Keywords :
Calibration; Electrical resistance measurement; Measurement standards; Microprogramming; Q measurement; Radio frequency; Reflection; Scattering parameters; Semiconductor device modeling; System testing;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387860
