DocumentCode
2458448
Title
Novel concept for a dual on wafer probe tip and corresponding calibration techniques
Author
Schott, Steffen ; Thies, Steffen ; Wollitzer, Michael ; Rosenberger, Bernd
fYear
2004
fDate
38149
Firstpage
97
Lastpage
102
Keywords
Calibration; Contacts; Coplanar waveguides; Delay; Fingers; Power transmission lines; Probes; Radio frequency; Signal design; Transmission line theory;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN
0-7803-8371-0
Type
conf
DOI
10.1109/ARFTG.2004.1387862
Filename
1387862
Link To Document