Title :
Consistent Correspondence between Arbitrary Manifold Surfaces
Author :
Wu, Huai-Yu ; Pan, Chunhong ; Yang, Qing ; Ma, Songde
Author_Institution :
Chinese Acad. of Sci., Beijing
Abstract :
We propose a novel framework for consistent correspondence between arbitrary manifold meshes. Different from most existing methods, our approach directly maps the connectivity of the source mesh onto the target mesh without needing to segment input meshes, thus effectively avoids dealing with unstable extreme conditions (e.g. complex boundaries or high genus). In this paper, firstly, a novel mean-value Laplacian fitting scheme is proposed, which aims at computing a shape-preserving (conformal) correspondence directly in 3D-to-3D space, efficiently avoiding local optimum caused by the nearest-point search, and achieving good results even with only a few marker points. Secondly, we introduce a vertex relocation and projection approach, which refines the initial fitting result in the way of local conformity. Each vertex of the initial result is gradually projected onto the target model´s surface to ensure a complete surface match. Furthermore, we provide a fast and effective approach to automatically detect critic points in the context of consistent correspondence. By fitting these critic points that capture the important features of the target mesh, the output compatible mesh matches the target mesh´s profiles quite well. Compared with previous approaches, our scheme is robust, fast, and convenient, thus suitable for common applications.
Keywords :
Laplace equations; curve fitting; mesh generation; arbitrary manifold surfaces; mean-value Laplacian fitting scheme; nearest-point search; projection approach; shape-preserving correspondence; source mesh; surface match; vertex relocation; Geometry; Laboratories; Laplace equations; Mesh generation; Pattern recognition; Robustness; Shape; Surface fitting; Surface texture; Topology;
Conference_Titel :
Computer Vision, 2007. ICCV 2007. IEEE 11th International Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-1630-1
Electronic_ISBN :
1550-5499
DOI :
10.1109/ICCV.2007.4408908