DocumentCode :
2459648
Title :
General accuracy of the FEM solutions on ampere´s law for a highly saturated magnetic device wrm a large air-gap
Author :
Sharifi, M. ; Lavers, J.D.
Author_Institution :
University of Toronto
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
148
Lastpage :
148
Keywords :
Atomic layer deposition; Atomic measurements; Grain boundaries; Grain size; Magnetic devices; Magnetic field measurement; Magnetic multilayers; Magnetization; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.871927
Filename :
871927
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2459648
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