Title :
Resolution and Visibility Enhancement of Ultrasonic Echoes Reflected from Targets Hidden by Highly Reverberant Thin Layers
Keywords :
Bismuth; Computer simulation; Integrated circuit modeling; Mathematical model; Reverberation; Signal resolution; Signal to noise ratio; Thickness measurement; Ultrasonic imaging; Ultrasonic variables measurement;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198433
