Title :
Precision volume measurements on silicon spheres
Author :
Sacconi, A. ; Panciera, R. ; Pasin, W.
Author_Institution :
Istituto di Metrol., CNR, Torino, Italy
Abstract :
In the determination of the Avogadro constant N/sub A/, use is made of silicon spheres as volume-density standards, where volume measurements play a critical role. The experience gained at the IMGC is reviewed and new data are presented on the reproducibility of the results together with some preliminary data on thermal expansion measurements.
Keywords :
constants; elemental semiconductors; measurement standards; silicon; thermal expansion measurement; volume measurement; Avogadro constant; IMGC; Si; precision volume measurements; reproducibility; spheres; thermal expansion measurements; volume-density standards; Density measurement; Gain measurement; Instruments; Lattices; Length measurement; Measurement standards; Silicon; Temperature; Thermal expansion; Volume measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547173
