Title :
Stepped-waveguide technique for the extraction of the electromagnetic parameters of conductor-backed absorbers
Author :
Frasch, Jonathan L. ; Rothwell, Edward J. ; Crowgey, Benjamin R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
A technique to extract the electromagnetic properties of conductor-backed absorbing materials is introduced. The sample is first placed into a waveguide, completely filling its cross-section. Then a portion of the sample is fit into a reduced-step guide. The two measured reflection coefficients provide sufficient information to obtain both the complex permittivity and permeability of the sample. The usefulness of the technique may be evaluated by testing the sensitivity of the extracted material parameters to instrumentation uncertainty.
Keywords :
conductors (electric); electromagnetic wave absorption; electromagnetic wave reflection; permeability; permittivity; waveguides; complex permittivity; conductor-backed absorbing materials; cross-section; electromagnetic parameter extraction; instrumentation uncertainty; measured reflection coefficients; permeability; reduced-step guide; stepped-waveguide technique; Electromagnetic waveguides; Materials; Permeability; Permeability measurement; Permittivity; Permittivity measurement; Reflection coefficient;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location :
Memphis, TN
Print_ISBN :
978-1-4799-3538-3
DOI :
10.1109/APS.2014.6904423