Title :
Annealing effect on exchange bias in NeFe/CrMn bilayers
Author :
Haiwen Xi ; Bo Bian ; Zailong Zhuang ; Laughlin, D.E. ; White, R.M.
Author_Institution :
Carnegie Mellon University
Keywords :
Anisotropic magnetoresistance; Annealing; Coercive force; Electrons; Giant magnetoresistance; Magnetic field measurement; Magnetic films; Magnetic materials; Temperature; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.872066