DocumentCode :
2462365
Title :
Local magnetoresistive response in thin-film Ni-Fe read elements: a sub-micrometer-resolution measurement system
Author :
Cross, R.W. ; Kos, A.B. ; Thompson, C.A. ; Brug, J.A. ; Petersen, T.W.
Author_Institution :
National Institute of Standards and Technology
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
395
Lastpage :
395
Keywords :
Area measurement; Magnetic domains; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic noise; Magnetization; Magnetoresistance; Size measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696578
Filename :
696578
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462365
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