• DocumentCode
    2463383
  • Title

    Robust edge detection

  • Author

    Kundu, Amlan

  • Author_Institution
    Dept. of Electr. Eng., State Univ. of New York, Buffalo, NY, USA
  • fYear
    1989
  • fDate
    4-8 Jun 1989
  • Firstpage
    11
  • Lastpage
    18
  • Abstract
    A robust edge-detection algorithm which performs equally under a wide variety of noisy situations and a broad range of edges is described. The algorithm is executed in three phases. In phase 1, the step and linear edges are detected from the noise-corrupted image using a statistical classification technique. In phase 2, all the thin-line edges (i.e. which are lines less than two pixels wide) are detected by a supplementary technique since these edges cannot be detected simultaneously with the other step and linear edges. In phase 3, the spurious edge elements are suppressed and the isolated missing edge elements are interpolated using a number of hypothesized edge-segments. Finally some experimental results are provided to illustrate the success of the algorithm
  • Keywords
    pattern recognition; picture processing; statistical analysis; edge detection; linear edges; noise-corrupted image; pattern recognition; picture processing; spurious edge; statistical classification; step edge; thin-line edges; Computational efficiency; Computer vision; Degradation; Gaussian noise; Image edge detection; Noise robustness; Phase detection; Phase noise; Signal to noise ratio; Smoothing methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1063-6919
  • Print_ISBN
    0-8186-1952-x
  • Type

    conf

  • DOI
    10.1109/CVPR.1989.37823
  • Filename
    37823