Title :
Restoration of reflectogram by extrapolation wideband microwave measurements by method of minimum duration
Author :
Vovk, S.M. ; Borulko, V.F.
Author_Institution :
Dnipropetrovsk Nat. Univ., Ukraine
Abstract :
Problems of reflectogram restoration and autocorrelation function of reflectogram restorations are considered. The method of minimum duration is modified for cases of spectra extrapolation onto lower and higher frequencies. Optimal values of work parameters of "generalized" functional of duration are found. Results of numeric simulation are presented for one-layered dielectric structure.
Keywords :
dielectric materials; electromagnetic wave reflection; extrapolation; inverse problems; microwave reflectometry; reflectometers; autocorrelation function; inverse problem; minimum duration method; one-layered dielectric structure; reflectogram restoration; spectra extrapolation; wideband microwave measurement; Autocorrelation; Dielectric materials; Dielectric measurements; Electromagnetic measurements; Extrapolation; Frequency dependence; Frequency measurement; Microwave measurements; Microwave theory and techniques; Wideband;
Conference_Titel :
Ultrawideband and Ultrashort Impulse Signals, 2004 Second International Workshop
Print_ISBN :
0-7803-8673-6
DOI :
10.1109/UWBUS.2004.1388083
