DocumentCode :
2463845
Title :
Deposition of droplet-free films by vacuum arc evaporation-results and applications
Author :
Witke, T. ; Siemroth, P.
Author_Institution :
Fraunhofer Inst. Mater. & Beam Technol., Dresden, Germany
Volume :
2
fYear :
1998
fDate :
17-21 Aug 1998
Firstpage :
605
Abstract :
A high current metal ion source has been designed and successfully used for activated deposition. An ion beam of some amperes is produced by transporting the fully ionized plasma from a pulsed high current vacuum arc through a curved magnetic duct. Deposition rates of some ten nm per second can be achieved. The deposited layers are free of particles, holes and pits. Films of about 50 nm have been deposited homogeneously (thickness variation below 5%) on a 4 inch substrate after 300 pulses. Repetition rates are adjustable from more than 100 Hz down to single pulses in dependence on the acceptable thermal input. Several applications are described in the paper: (1) deposition of hard, amorphous carbon films; (2) droplet-free TiN films for advanced applications; (3) transparent Al2O3 protective coatings; and (4) metallization for microelectronics
Keywords :
metallisation; plasma deposited coatings; plasma deposition; protective coatings; thin films; vacuum arcs; 50 mum; Al2O3; C; TiN; applications; curved magnetic duct; deposition rates; droplet-free films deposition; fully ionized plasma; high-current metal ion source; microelectronics metallisation; protective coatings; pulsed high-current vacuum arc; repetition rates; vacuum arc evaporation; Amorphous magnetic materials; Amorphous materials; Diamond-like carbon; Ducts; Ion beams; Ion sources; Magnetic films; Plasma sources; Plasma transport processes; Vacuum arcs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location :
Eindhoven
ISSN :
1093-2941
Print_ISBN :
0-7803-3953-3
Type :
conf
DOI :
10.1109/DEIV.1998.738784
Filename :
738784
Link To Document :
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