DocumentCode :
2464378
Title :
Flying characteristics for chip-on-caps (COC)
Author :
Ohwe, T. ; Gouo, A. ; Mutoh, H. ; Miura, H. ; Tamura, F. ; Kira, H.
Author_Institution :
Fujitsu Ltd.
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
405
Lastpage :
405
Keywords :
Bonding; Semiconductor device measurement; Temperature; Thermal loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872180
Filename :
872180
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2464378