Title :
The effect of cluster size on media noise in Co-Ni-P thin films
Author :
Rauch, G.C. ; Chongwon Byun ; Johns, E.R.C. ; Messinger, C. ; Greggi, J.
Author_Institution :
Digital Equipment Corporation
Keywords :
Background noise; Coercive force; Couplings; Diffraction; Electrons; Grain size; Microstructure; Signal to noise ratio; Size control; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696591
