Title :
Magneto-optical measurement of interactions in thin-film media
Author :
Alex, M. ; Gudeman, C. ; Peter, D.
Author_Institution :
IBM Corporation
Keywords :
Anisotropic magnetoresistance; Magnetic field measurement; Magnetization; Noise measurement; Samarium; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696593
