Digital Recognition Based on Image Device Meters

Author

Bin, Ma ; Xiangbin, Meng ; Xiaofu, Ma ; Wufeng, Li ; Linchong, Hao ; Dean, Jiang

Author_Institution

Inf. & Control Eng. Fac., Shenyang Jianzhu Univ., Shenyang, China

Volume

3

fYear

2010

fDate

16-17 Dec. 2010

Firstpage

326

Lastpage

330

Abstract

Analysis the characteristics of meter digital structure, considering the complexity of the meter digital images background, combines dynamic threshold and global threshold binary image on instrument digital image pre-processing. Locating the digital on the instrument, eliminated pattern noise by opening operation and removed small adhesions between the digital and the border, utilized the connected domain screening method to fulfill the meter digital precision positioning. Discussed recognition methods of meter digital based on eigenvector. The results showed that the recognition rate of this solution was 97.5%, and the recognition speed was extremely fast, which perfectly met the recognition requirements: accuracy and speed.

Keywords

computerised instrumentation; eigenvalues and eigenfunctions; image recognition; meters; digital recognition; dynamic threshold binary image; eigenvector; global threshold binary image; image device meters; meter digital images; meter digital precision positioning; Adhesives; Character recognition; Eigenvalues and eigenfunctions; Image recognition; Pixel; Digital Locating; Digital Recognition; Eigenvector; Image Preprocessing;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Systems (GCIS), 2010 Second WRI Global Congress on

Conference_Location

Wuhan

Print_ISBN

978-1-4244-9247-3

Type

conf

DOI

10.1109/GCIS.2010.134

Filename

5709386