DocumentCode :
2465050
Title :
Study and fabrication of amorphous and microcrystalline silicon-carbon alloys for microelectronic applications
Author :
Marsal, Lluis F. ; Pallares, J. ; Correig, Xavier ; Calvo-Barrio, L. ; Dominguez, Manuel ; Bard, Daniel ; Calderer, Josep ; Alcubilla, Ramon
Author_Institution :
Dept. d´´Enginyeria Electron, Univ. Rovira i Virgili, Tarragona, Spain
fYear :
1996
fDate :
29 Apr-3 May 1996
Firstpage :
201
Lastpage :
204
Abstract :
Results on amorphous and microcrystalline silicon carbon alloy layers obtained by plasma enhanced chemical vapor deposition are reported. The investigations are focused on the deposition rate and carbon content for different deposition conditions. In order to assess the applicability of silicon carbon alloys films, heterojunctions of amorphous-SiC:H/crystalline Si (a-SiC:H/c-Si) and microcrystalline-SiC:H/crystalline Si (μc-SiC:H/c-Si) diodes were fabricated and their current-voltage characteristics were compared. The obtained results indicate that the μc-SiC:H/c-Si heterojunction presents electrical properties suitable for heterojunction bipolar transistor fabrication
Keywords :
amorphous semiconductors; heterojunction bipolar transistors; hydrogen; plasma CVD; semiconductor growth; semiconductor thin films; silicon compounds; SiC:H-Si; amorphous layers; carbon content; current-voltage characteristics; deposition rate; heterojunction bipolar transistor; heterojunctions; microcrystalline layers; microelectronic applications; plasma enhanced chemical vapor deposition; Amorphous materials; Chemical vapor deposition; Crystallization; Current-voltage characteristics; Diodes; Fabrication; Heterojunctions; Plasma chemistry; Semiconductor films; Silicon alloys;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
Conference_Location :
Toulouse
Print_ISBN :
0-7803-3179-6
Type :
conf
DOI :
10.1109/SIM.1996.570939
Filename :
570939
Link To Document :
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