• DocumentCode
    2465614
  • Title

    MIMO-OFDM Throughput Performances on MIMO Antenna Configurations Using LTE-Based Testbed with 100 MHz Bandwidth

  • Author

    Miyazaki, Noriaki ; Nanba, Shinobu ; Konishi, Satoshi

  • Author_Institution
    KDDI R&D Labs., Inc., Fujimino, Japan
  • fYear
    2010
  • fDate
    6-9 Sept. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents throughput performance of 2 × 2 multiple-input multiple-output (MIMO)-orthogonal frequency division multiplexing (OFDM) using a testbed in line with the Long Term Evolution (LTE) numerology. Then, this paper clarifies the relation among the throughput, modulation schemes and antenna polarization. The field experiments clearly demonstrate that a measured throughput exceeding 200 Mbps can be obtained in a coverage area more than 50% and a throughput of 456.0 Mbps is achieved for a limited number of users even when a maximum Doppler frequency is higher than 125 Hz. In addition, it is found that the single polarization antenna configuration is suitable for 16QAM while the dual polarization antenna configuration is suitable for 64QAM. It is concluded from analysis of the eigenvalue ratio and signal to noise power ratio that the aforementioned trade-off is caused by sensitivity to the eigenvalue ratio depending on the modulation scheme and distribution of the eigenvalue ratio depending on the MIMO antenna configuration.
  • Keywords
    MIMO communication; OFDM modulation; antennas; quadrature amplitude modulation; 16QAM; LTE-based testbed; MIMO antenna configuration; MIMO-OFDM throughput performance; dual polarization antenna configuration; long term evolution; multiple-input multiple-output-orthogonal frequency division multiplexing; single polarization antenna configuration; Antenna measurements; Antennas; Eigenvalues and eigenfunctions; MIMO; OFDM; Signal to noise ratio; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
  • Conference_Location
    Ottawa, ON
  • ISSN
    1090-3038
  • Print_ISBN
    978-1-4244-3573-9
  • Electronic_ISBN
    1090-3038
  • Type

    conf

  • DOI
    10.1109/VETECF.2010.5594527
  • Filename
    5594527