Title :
Power efficient charge pump circuit in standard twin-well CMOS technology
Author :
Lee, Jung-Chan ; Park, Jin-Young ; Chung, Yeonbae
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ.y, Daegu
Abstract :
In this paper, we present a new charge pump circuit feasible for the implementation with standard twin-well CMOS process technology. The proposed charge pump employs PMOS-switching dual charge-transfer paths and a simple two-phase clock. Since charge transfer switches are fully turned on during each half of clock cycle, they transfer charges completely from the present stage to the next stage without suffering threshold voltage drop. During one clock cycle, the pump transfers charges twice through two pumping paths which are operating alternately. The performance comparison by simulations shows that the proposed charge pump exhibits the higher output voltage, the larger output current, and thus a better power efficiency over the traditional twin-well charge pumps.
Keywords :
charge pump circuits; clocks; PMOS-switching dual charge-transfer paths; power efficiency; power efficient charge pump circuit; twin-well CMOS process technology; two-phase clock; CMOS process; CMOS technology; Capacitors; Charge pumps; Charge transfer; Circuits; Clocks; Diodes; MOS devices; Threshold voltage;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
DOI :
10.1109/EDSSC.2008.4760639