DocumentCode
2467345
Title
Refinements to the MICHELLE Secondary Electron Emission model for simulating multi-stage depressed collector operation
Author
Dionne, Norman J. ; Petillo, John J.
Author_Institution
Raytheon Co., Sudbury, MA, USA
fYear
2002
fDate
2002
Firstpage
162
Lastpage
163
Abstract
The Secondary Electron Emission model in the MICHELLE code has undergone several refinements over the past year. MICHELLE, an advanced, three-dimensional electron beam design tool is currently under development by a team lead by SAIC under NRL/ONR sponsorship. As part of this new effort, an algorithmic representation of a comprehensive model of secondary emission is being developed for this computational tool in order to achieve an accurate beam collection design capability.
Keywords
secondary electron emission; MICHELLE simulation code; multi-stage depressed collector operation; secondary electron emission model; three-dimensional electron beam collection design; Carbon dioxide; Delay effects; Electrodes; Electron beams; Electron emission; Gyrotrons; Klystrons; Radio frequency; Refining; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
Print_ISBN
0-7803-7256-5
Type
conf
DOI
10.1109/IVELEC.2002.999315
Filename
999315
Link To Document