Title :
New routes and diversifications ofr nanoelectronics by the end of the roadmap and beyond
Author :
Deleonibus, Simon ; Aid, M. ; De Salvo, B. ; Ernst, T. ; Faynot, O. ; Fedeli, J. -M ; Giffard, B. ; Le Royer, C. ; Poiroux, T. ; Robert, P. ; Sillon, N. ; Vinet, M.
Author_Institution :
CEA-LETI, MINATEC, Grenoble
Abstract :
The microelectronics industry is facing historical challenges to down scale CMOS devices through the demand for low voltage, low power, high performance and increased functionalities. The implementation of new materials and devices architectures will be necessary. HiK gate dielectric and metal gate are among the most strategic options to reduce power consumption and manage low supply voltage. Multigate architectures increase MOSFETs drivability, reduce power, and allow new memory devices opportunities for future applications. By introducing new materials(HiK, Ge, III-V, Carbon based materials like diamond, graphene and CNTs, molecules,...), and new function such as sensing and actuation allowing to interface the outside world (M/NEMS, filters, Imagers,...) Si based CMOS will be scaled beyond the ITRS as the System-on-Chip/Wafer Platform. The Heterogeneous integration of these devices with CMOS will require new 3D and Packaging schemes leading to the increase of effective packing density, improving systems figures of merit.
Keywords :
CMOS integrated circuits; III-V semiconductors; MOS integrated circuits; carbon nanotubes; diamond; elemental semiconductors; germanium; integrated circuit packaging; nanoelectronics; CMOS devices; MOSFETs drivability; gate dielectric; metal gate; nanoelectronics; packing density; reduce power; system-on-chip/wafer platform; CMOS image sensors; Diamond-like carbon; Dielectric materials; Energy consumption; Energy management; III-V semiconductor materials; Low voltage; MOSFETs; Microelectronics; Nanoelectronics; 3D SOW; 3D-TSV; BAW; CMOSFETS; Diamond; Flash Memories; Germanium; Heterogeneous; Imagers; MEMS; NEMS; Nanocrystals; Optical interconnect; RF; Silicon on insulator technology; Strain; Switch; Wafer bonding;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
DOI :
10.1109/EDSSC.2008.4760730