DocumentCode :
2467523
Title :
CMOS image sensors and camera-on-a-chip for low-light level biomedical applications
Author :
Deen, M. Jamal ; Desouki, M. ; Faramarzpour, Naser
Author_Institution :
Electr. & Comput. Eng. Dept., McMaster Univ., Hamilton, ON
fYear :
2008
fDate :
8-10 Dec. 2008
Firstpage :
1
Lastpage :
6
Abstract :
With the advances in deep submicron CMOS technologies, CMOS-based active-pixel sensors (APS) have become a practical alternative to charge-coupled devices (CCD) imaging technology. Key advantages of CMOS image sensors are that they are fabricated in standard CMOS technologies, which allow full integration of the image sensor along with the analog and digital processing and control circuits on the same chip and that they are of low cost. Since there is a practical limit on the minimum pixel size (4~5 mum), then CMOS technology scaling can allow for an increased number of transistors to be integrated into the pixel. Such smart pixels truly show the potential of CMOS technology in imaging applications, especially for high-speed applications. This work discusses various active-pixel sensors (APS) and shows the feasibility of using the DC-level to increase the sensitivity of the pixel for low-level light applications. Avalanche-photodiodes (APDs) are described, in addition to a discussion of the breakdown mechanism and microplasma in avalanche breakdown for single photon APDs. A fully integrated, 16 times 16 pixel CMOS camera-on-a-chip, fabricated in a standard CMOS 0.18 mum technology is also shown in this work. The array is based on 256 APS with a pixel size of 20 mum times 30 mum, a fill-factor of 60% with all digital and analog blocks implemented on-chip.
Keywords :
CMOS image sensors; avalanche breakdown; avalanche photodiodes; biomedical equipment; biomedical optical imaging; CMOS image sensors; CMOS technology scaling; active-pixel sensors; analog processing; avalanche breakdown; avalanche-photodiodes; biomedical applications; camera-on-a-chip; charge-coupled device imaging; control circuits; digital processing; fill-factor; high-speed applications; low-light level applications; microplasma; optical molecular imaging systems; standard CMOS technologies; transistors; Avalanche breakdown; Biomedical imaging; Biosensors; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS image sensors; CMOS process; CMOS technology; Charge coupled devices; Charge-coupled image sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
Type :
conf
DOI :
10.1109/EDSSC.2008.4760731
Filename :
4760731
Link To Document :
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