• DocumentCode
    2467665
  • Title

    Noise factors in dftection of minute marks by domain wall displacement

  • Author

    Kaneko, M. ; Yoshimura, S. ; Fujita, G.

  • Author_Institution
    Sony Corporation
  • fYear
    2000
  • fDate
    9-13 April 2000
  • Firstpage
    579
  • Lastpage
    579
  • Keywords
    Error analysis; Intersymbol interference; Jitter; Magnetic analysis; Magnetic fields; Magnetic modulators; Magnetic noise; Noise shaping; Pattern analysis; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
  • Conference_Location
    Toronto, ON, Canada
  • Print_ISBN
    0-7803-5943-7
  • Type

    conf

  • DOI
    10.1109/INTMAG.2000.872354
  • Filename
    872354