• DocumentCode
    2467720
  • Title

    Series architecture for fault tolerant PM drives: Operating modes with one or two DC voltage source(s)

  • Author

    Shamsi-Nejad, Mohammad-Ali ; Nahid-Mobarakeh, Babak ; Pierfederici, Serge ; Meibody-Tabar, Farid

  • Author_Institution
    Groupe de Rech. en Electrotech. et Electron. de Nancy (GREEN), Nancy Univ., Vandoeuvre-Les-Nancy, France
  • fYear
    2010
  • fDate
    14-17 March 2010
  • Firstpage
    1525
  • Lastpage
    1530
  • Abstract
    A fault tolerant drive based on a series architecture (one or two DC sources, two voltage source inverters and a PMSM) is studied in this paper. Three different operating modes are considered: normal mode, open-circuit degraded mode and short-circuit degraded mode. For each case, an adapted torque control strategy is proposed, applied and tested. The main contribution lies in the control strategies for degraded modes. For the open phase mode, different operating criteria are considered. For short-circuit faults, two solutions are proposed. The proposed strategies in this paper are tested on a drive realized for aerospace applications. The proposed techniques here allow operating under fault conditions in real-time and their implementation is easy. The experimental results show the validity of the proposed methods.
  • Keywords
    adaptive control; aerospace components; electric drives; electric vehicles; fault tolerance; invertors; permanent magnet machines; synchronous machines; torque control; DC voltage source; PMSM; adapted torque control strategy; fault tolerant PM drive series architecture; open-circuit degraded mode; short-circuit degraded mode; short-circuit faults; voltage source inverters; Aerospace testing; Degradation; Fault tolerance; Inverters; Magnetic flux; Magnetic semiconductors; Switches; Torque control; Virtual colonoscopy; Voltage; Fault tolerant drives; PMSM; open phase fault; short-circuit fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology (ICIT), 2010 IEEE International Conference on
  • Conference_Location
    Vi a del Mar
  • Print_ISBN
    978-1-4244-5695-6
  • Electronic_ISBN
    978-1-4244-5696-3
  • Type

    conf

  • DOI
    10.1109/ICIT.2010.5472471
  • Filename
    5472471