Electron transport in thin insulating films; physics and effects on dielectric aging

Author

Pfluger, P. ; Cartier, E. ; Dersch, H.

Author_Institution

Asea Brown Boveri Corp. Res., Baden-Dattwil, Switzerland

fYear

1988

fDate

5-8 June 1988

Firstpage

135

Lastpage

140

Abstract

In dielectrics under high electrical fields, the energy distribution of the conduction electrons, N(E,F), plays a decisive role. Experimental methods (mainly vacuum spectroscopic techniques) are presented which make it possible to measure the energy distribution of conduction electrons, N(E). Its field dependence, N(E,F), can also be determined if the scattering rates for the carriers are known in the energy range of interest. Results obtained for saturated hydrocarbon and SiO/sub 2/ thin films are discussed.<>

Keywords

ageing; electron energy loss spectra; electronic conduction in insulating thin films; high field effects; photoemission; SiO/sub 2/ thin films; carrier scattering rates; conduction electron energy distribution; dielectric aging; electron transport; high electrical fields; hydrocarbon thin films; thin insulating films; vacuum spectroscopic techniques; Dielectric measurements; Dielectric thin films; Dielectrics and electrical insulation; Electrons; Elementary particle vacuum; Energy measurement; Physics; Scattering; Spectroscopy; Vacuum technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on

Conference_Location

Cambridge, MA, USA

ISSN

1089-084X

Type

conf

DOI

10.1109/ELINSL.1988.13887

Filename

13887