DocumentCode
2469262
Title
Fast time-frequency domain reflectometry based on the AR coefficient estimation of a chirp signal
Author
Doo, Seung Ho ; Ra, Won-Sang ; Yoon, Tae Sung ; Park, Jin Bae
Author_Institution
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
fYear
2009
fDate
10-12 June 2009
Firstpage
3423
Lastpage
3428
Abstract
In this paper, a novel reflectometry, which is characterized by a simple autoregressive (AR) modeling of a chirp signal and an weighted robust least squares (WRLS) AR coefficient estimator, is proposed. In spite of its superior fault detection performance over the conventional reflectometries, the recently developed time-frequency domain reflectometry (TFDR) might not be suitable for real-time implementation because it requires heavy computational burden. In order to solve this critical limitation, in our method, the time-frequency analysis is performed based on the estimated time-varying AR coefficient of a chirp signal. To do this, a new chirp signal model which contains a single time-varying AR coefficient is suggested. In addition, to ensure the noise insensitivity, the WRLS estimator is used to estimate the time-varying AR coefficient. As a result, the proposed reflectometry method can drastically reduce the computational complexity and provide the satisfactory fault detection performance even in noisy environments. To evaluate the fault detection performance of the proposed method, simulations and experiments are carried out. The results demonstrate that the proposed algorithm could be an excellent choice for the real-time reflectometry.
Keywords
autoregressive processes; computational complexity; fault diagnosis; least squares approximations; time-domain reflectometry; time-frequency analysis; autoregressive modeling; chirp signal; computational complexity; fault detection; noise insensitivity; time-frequency analysis; time-frequency domain reflectometry; time-varying AR coefficient; weighted robust least squares AR coefficient estimation; Chirp; Computational complexity; Computational modeling; Fault detection; Least squares approximation; Noise reduction; Reflectometry; Robustness; Time frequency analysis; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2009. ACC '09.
Conference_Location
St. Louis, MO
ISSN
0743-1619
Print_ISBN
978-1-4244-4523-3
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2009.5160315
Filename
5160315
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