• DocumentCode
    2469877
  • Title

    Influences on thermal fatigue reliability of QFP component solder joints based on physic-of-failure method

  • Author

    Wang, Xinghao ; Shao, Jiang ; Liu, Xiaoyu ; Lu, Fengming

  • Author_Institution
    Quality Eng. Center, China Aero-Polytechnology Establ., Beijing, China
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Physics-of-failure (POF) method based reliability prediction technology is one of the key technologies in prognostic and health management (PHM) field. Based on CalceSARA, a physics-of-failure based reliability assessment software developed by University of Maryland, influences on solder joints thermal fatigue reliability of QFP component were researched in detail, and the influences of six types of parameters such as package material, lead span, lead material, lead thickness, solder height and solder joints bond area on thermal fatigue life of solder joints were analyzed. The results indicated that under temperature cycle loading, the fatigue life of solder joints is positively correlated with solder height and solder joints bond area, and is negatively correlated with lead span and lead thickness, and the fatigue life of components with plastic package and copper alloy lead is longer than components with ceramic package and iron-nickel alloy lead. This study can provide guideline and reference for selection and usage of electronic components in reliability design.
  • Keywords
    ceramic packaging; copper alloys; iron alloys; nickel alloys; reliability; solders; thermal stress cracking; CalceSARA; Cu; Fe-Ni; Maryland University; QFP component solder joints; ceramic package; electronic components; lead material; lead span; lead thickness; package material; physic-of-failure method; plastic package; prognostic and health management field; reliability assessment software; reliability design; reliability prediction technology; solder height; solder joints bond area; solder joints thermal fatigue reliability; temperature cycle loading; thermal fatigue life; Physics-of-failure; QFP; reliability; solder joints; thermal fatigue life;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management (PHM), 2012 IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    2166-563X
  • Print_ISBN
    978-1-4577-1909-7
  • Electronic_ISBN
    2166-563X
  • Type

    conf

  • DOI
    10.1109/PHM.2012.6228873
  • Filename
    6228873