DocumentCode
2470293
Title
IMPRES: integrated monitoring for processor reliability and security
Author
Ragel, R.G. ; Parameswaran, S.
Author_Institution
Sch. of Comput. Sci. & Eng., New South Wales Univ., Sydney, NSW
fYear
2006
fDate
24-28 July 2006
Firstpage
502
Lastpage
505
Abstract
Security and reliability in processor based systems are concerns requiring adroit solutions. Security is often compromised by code injection attacks, jeopardizing even ´trusted software´. Reliability is of concern where unintended code is executed in modern processors with ever smaller feature sizes and low voltage swings causing bit flips. Countermeasures by software-only approaches increase code size by large amounts and therefore significantly reduce performance. Hardware assisted approaches add extensive amounts of hardware monitors and thus incur unacceptably high hardware cost. This paper presents a novel hardware/software technique at the granularity of micro-instructions to reduce overheads considerably. Experiments show that our technique incurs an additional hardware overhead of 0.91% and clock period increase of 0.06%. Average clock cycle and code size overheads are just 11.9% and 10.6% for five industry standard application benchmarks. These overheads are far smaller than have been previously encountered
Keywords
cryptography; fault tolerant computing; hardware-software codesign; semiconductor device reliability; IMPRES; additional hardware overhead; adroit solutions; basic block check summing; bit flips detection; checksum encryption; code injection attacks detection; hardware/software technique; integrated monitoring for processor reliability and security; low voltage swings; microinstructions; processor based systems; unintended code; Australia; Clocks; Communication system security; Computer security; Computerized monitoring; Costs; Cryptography; Hardware; Information security; National security; Basic Block Check-summing; Bit Flips Detection; Checksum Encryption; Design; Detecting Code Injection Attacks; Performance; Reliability; Security;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
1-59593-381-6
Type
conf
DOI
10.1109/DAC.2006.229268
Filename
1688849
Link To Document