DocumentCode
2472018
Title
Monitoring Thin-Film Etching Using Surface Acoustic Waves
Author
Joshi, S.G.
fYear
1987
fDate
14-16 Oct. 1987
Firstpage
601
Lastpage
604
Keywords
Acoustic waves; Delay lines; Etching; Monitoring; Oscillators; Plasma applications; Plasma materials processing; Resists; Surface acoustic waves; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE 1987 Ultrasonics Symposium
Conference_Location
Denver, Colorado, USA
Type
conf
DOI
10.1109/ULTSYM.1987.199028
Filename
1535968
Link To Document