DocumentCode
2472452
Title
7E-5 Temperature Coefficients Measured by Picosecond Ultrasonics on Materials in Thin Films for Bulk Acoustic Wave Technology
Author
Emery, P. ; Petit, D. ; Ancey, P. ; Devos, A.
Author_Institution
STMicroelectronics, Crolles
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
612
Lastpage
615
Abstract
To achieve standards specifications bulk acoustic wave (BAW) resonators have to be temperature compensated. This resonators consist on multilayer stack of different materials: a piezoelectric stack composed of two electrodes at the top and bottom of a piezoelectric layer, and an acoustic isolation. The temperature compensation is usually done by increasing the thickness of a silicon dioxide layer which presents a positive temperature coefficient. In order to improve and predict the behavior of the device, temperature coefficients of the different materials of the device have to be characterized. In this paper we present measurements of the dependence of sound velocity versus temperature by picosecond ultrasonics.
Keywords
acoustic resonators; bulk acoustic wave devices; piezoelectric thin films; ultrasonic measurement; BAW resonators; acoustic isolation; bulk acoustic wave resonators; picosecond ultrasonics; piezoelectric layer; temperature coefficient; thin films; Acoustic materials; Acoustic measurements; Acoustic waves; Isolation technology; Nonhomogeneous media; Piezoelectric films; Piezoelectric materials; Temperature measurement; Transistors; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.159
Filename
4409732
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