• DocumentCode
    2472452
  • Title

    7E-5 Temperature Coefficients Measured by Picosecond Ultrasonics on Materials in Thin Films for Bulk Acoustic Wave Technology

  • Author

    Emery, P. ; Petit, D. ; Ancey, P. ; Devos, A.

  • Author_Institution
    STMicroelectronics, Crolles
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    612
  • Lastpage
    615
  • Abstract
    To achieve standards specifications bulk acoustic wave (BAW) resonators have to be temperature compensated. This resonators consist on multilayer stack of different materials: a piezoelectric stack composed of two electrodes at the top and bottom of a piezoelectric layer, and an acoustic isolation. The temperature compensation is usually done by increasing the thickness of a silicon dioxide layer which presents a positive temperature coefficient. In order to improve and predict the behavior of the device, temperature coefficients of the different materials of the device have to be characterized. In this paper we present measurements of the dependence of sound velocity versus temperature by picosecond ultrasonics.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; piezoelectric thin films; ultrasonic measurement; BAW resonators; acoustic isolation; bulk acoustic wave resonators; picosecond ultrasonics; piezoelectric layer; temperature coefficient; thin films; Acoustic materials; Acoustic measurements; Acoustic waves; Isolation technology; Nonhomogeneous media; Piezoelectric films; Piezoelectric materials; Temperature measurement; Transistors; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.159
  • Filename
    4409732