DocumentCode :
2474160
Title :
Effect of aging of breakdown voltage of artificially damaged cable
Author :
Hanson, B.A. ; Reynolds, A.B.
Author_Institution :
Dept. of Mech., Aerosp. & Nucl. Eng., Virginia Univ., Charlottesville, VA, USA
fYear :
1993
fDate :
17-20 Oct 1993
Firstpage :
787
Lastpage :
792
Abstract :
The effect of flaws and thermal and radiation aging of flaws on the electrical breakdown of low-voltage cable was studied. AC breakdown voltages of XLPE (cross-linked polyethylene) and EPR (ethylene-propylene rubber) cables were measured for both damaged and undamaged cable. Three types of flaws were studied: scrapes, transverse cuts, and longitudinal cuts. Some cables were radiated-aged up to 1 MGy and others were thermally aged at 130°C for up to 50 days. Results to date indicate little effect of aging on breakdown voltage and a linear decrease in breakdown voltage with decreasing thickness beneath scrapes and transverse cuts below some threshold thickness. Calculated electric field distributions at breakdown indicate that breakdown occurs by partial discharge in pores
Keywords :
XLPE insulation; ageing; electric breakdown; ethylene-propylene rubber; partial discharges; power cable insulation; 130 degC; 50 days; AC breakdown voltages; EPR; XLPE; aging; artificially damaged cable; breakdown voltage; cross-linked polyethylene; electric field distributions; electrical breakdown; ethylene-propylene rubber; flaws; longitudinal cuts; low-voltage cable; partial discharge; pores; radiation aging; scrapes; thermal ageing; threshold thickness; transverse cuts; Aging; Breakdown voltage; Cable insulation; Electric breakdown; Paramagnetic resonance; Partial discharges; Power cables; Radiation safety; Safety devices; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
Type :
conf
DOI :
10.1109/CEIDP.1993.378877
Filename :
378877
Link To Document :
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