DocumentCode
247477
Title
Electromagnetic sensitivity analysis of RF gas micro/nano-breakdown
Author
Semnani, Abbas ; Peroulis, Dimitrios
Author_Institution
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
fYear
2014
fDate
6-11 July 2014
Firstpage
1602
Lastpage
1603
Abstract
RF gas micro-breakdown occurs in the presence of electric field in the order of 10s of V/μm. In addition to gas type, pressure and temperature, the breakdown field also depends on several microscopic parameters such as the secondary electron emission coefficient and the field enhancement factor. In this paper, the effects of these parameters on the electromagnetic properties of micro-plasma regions in different RF discharge regimes are evaluated. It is shown that the breakdown voltage and the characteristics of the resulting plasma are almost independent of these parameters in the diffusion-controlled region while the situation is different in the boundary-controlled area.
Keywords
electric breakdown; plasma properties; secondary electron emission; sensitivity analysis; RF gas micro/nano-breakdown; boundary-controlled area; breakdown field; breakdown voltage; diffusion-controlled region; electric field; electromagnetic properties; electromagnetic sensitivity analysis; field enhancement factor; microplasma regions; microscopic parameters; secondary electron emission coefficient; Cathodes; Discharges (electric); Ionization; Physics; Plasmas; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location
Memphis, TN
ISSN
1522-3965
Print_ISBN
978-1-4799-3538-3
Type
conf
DOI
10.1109/APS.2014.6905127
Filename
6905127
Link To Document