• DocumentCode
    247477
  • Title

    Electromagnetic sensitivity analysis of RF gas micro/nano-breakdown

  • Author

    Semnani, Abbas ; Peroulis, Dimitrios

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2014
  • fDate
    6-11 July 2014
  • Firstpage
    1602
  • Lastpage
    1603
  • Abstract
    RF gas micro-breakdown occurs in the presence of electric field in the order of 10s of V/μm. In addition to gas type, pressure and temperature, the breakdown field also depends on several microscopic parameters such as the secondary electron emission coefficient and the field enhancement factor. In this paper, the effects of these parameters on the electromagnetic properties of micro-plasma regions in different RF discharge regimes are evaluated. It is shown that the breakdown voltage and the characteristics of the resulting plasma are almost independent of these parameters in the diffusion-controlled region while the situation is different in the boundary-controlled area.
  • Keywords
    electric breakdown; plasma properties; secondary electron emission; sensitivity analysis; RF gas micro/nano-breakdown; boundary-controlled area; breakdown field; breakdown voltage; diffusion-controlled region; electric field; electromagnetic properties; electromagnetic sensitivity analysis; field enhancement factor; microplasma regions; microscopic parameters; secondary electron emission coefficient; Cathodes; Discharges (electric); Ionization; Physics; Plasmas; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
  • Conference_Location
    Memphis, TN
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4799-3538-3
  • Type

    conf

  • DOI
    10.1109/APS.2014.6905127
  • Filename
    6905127