Title :
A scalable autotest platform for embedded system
Author :
Liu, Di ; Su, Qiao ; Xie, Yan
Author_Institution :
Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
The complex and diversity of embedded system make the developing and testing embedded system a hard work. Providing a high-availability high-scale universal testing platform can improve the development of embedded software. The autotest platform focuses on layered scalability and continuous integration. Loose coupling between the layers makes the system easy to extend at the local layer. Continuous improvements reduce the initial investment, optimize the platform implementation, and expand capacity and capabilities according to requirements. Users commit test requests front-end, and background centralized testing cluster executes this task and returns results to users.
Keywords :
automatic test software; embedded systems; background centralized testing cluster; continuous integration; embedded software; embedded system; high-availability high-scale universal testing platform; scalable autotest platform; Embedded systems; Hardware; Monitoring; Schedules; Servers; Testing; Autotest; TDD; black box testing; embedded system;
Conference_Titel :
Apperceiving Computing and Intelligence Analysis (ICACIA), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8025-8
DOI :
10.1109/ICACIA.2010.5709928