Title :
Dual-edge-triggered FF with timing error detection capability
Author :
Namba, Kazuteru ; Katagiri, Takashi ; Ito, Hideo
Author_Institution :
Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan
Abstract :
This paper presents a construction of dual-edge-triggered flip-flops (DET-FFs) with timing error detection capability. The proposed FF is based on a conventional DET-FF and a conventional timing error detection method. While the conventional timing error detection uses a transition detector with the area of large, the proposed FF uses internal signals in a DET-FF as an alternative of the transition detector. This paper also shows an evaluation result indicating that the proposed FF has ten percent or smaller area overhead and lower power consumption than the simple combination of the conventional DET-FF and timing error detection methods.
Keywords :
flip-flops; DET-FF; dual-edge-triggered FF; dual-edge-triggered flip-flops; timing error detection capability; transition detector; Clocks; Delay; Detectors; Latches; Logic gates; Power demand;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378222