• DocumentCode
    2476471
  • Title

    Feedback control design for cluster tools with wafer residency time constraints

  • Author

    Kim, Chulhan ; Lee, Tae-Eog

  • Author_Institution
    Dept. of Ind. & Syst. Eng., KAIST, Daejeon, South Korea
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    3063
  • Lastpage
    3068
  • Abstract
    Cluster tools for semiconductor manufacturing have been studied widely in terms of transportation robot scheduling. Cluster tool systems are discrete event systems, and usually modeled in timed Petri nets and timed event graphs. Many efficient robot operation sequences such as the backward sequence and the swap sequence have been developed, but they do not guarantee efficiency under consideration of wafer residency time constraints for some process modules. In this paper, we propose a way to control cluster tools with wafer residency time constraints using the max-plus algebra and timed event graphs. Conditions to meet time constraints are developed, and we introduce a methodology to add feedback control arcs to timed event graph models of single-armed cluster tools with the backward sequence, and dual-armed cluster tools with the swap sequence. Bounded variation on processing times also considered as well as time constraints.
  • Keywords
    Petri nets; algebra; cluster tools; discrete event systems; feedback; graph theory; mobile robots; semiconductor technology; cluster tool; discrete event systems; feedback control design; max-plus algebra; robot operation sequence; semiconductor manufacturing; swap sequence; time constraint; timed Petri nets; timed event graph model; transportation robot scheduling; wafer residency time constraint; Algebra; Load modeling; Mathematical model; Robots; Semiconductor device modeling; Time factors; Transportation; cluster tools; feedback control; timed event graphs; wafer residency time constraints;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics (SMC), 2012 IEEE International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4673-1713-9
  • Electronic_ISBN
    978-1-4673-1712-2
  • Type

    conf

  • DOI
    10.1109/ICSMC.2012.6378261
  • Filename
    6378261