• DocumentCode
    2476489
  • Title

    Sub-nm order fluctuation control of narrowed pitch 2K-GxL™ device for high contrast

  • Author

    Ishikawa, Keita ; Saruta, Kunihiko ; Oniki, Kazunao ; Taguchi, Ayumu ; Yamaguchi, Masanari ; Yamashita, Keitaro ; Tamada, Hitoshi

  • Author_Institution
    Core Device Dev. Group, Sony Corp., Tokyo, Japan
  • fYear
    2009
  • fDate
    17-20 Aug. 2009
  • Firstpage
    45
  • Lastpage
    46
  • Abstract
    We developed a novel 2 K vertical resolution device, the 2K-GxL device, for a super real projector, which enabled ribbon pitch to be miniaturized and the contrast ratio to be high simultaneously. Shrinking the ribbon pitch from 4.25 mum from that of previous 1K-GxL device to 3.00 mum was done by introducing a tapered structure to the step region. A high device contrast ratio of 77000 was achieved by suppressing the fluctuation of ribbon height to under 0.32 nm by using the KrF lithography, and also developing a super flattened mirror.
  • Keywords
    lithography; micro-optomechanical devices; micromirrors; optical projectors; ges device contrast ratio; lithography; narrowed pitch 2K-GxL device; ribbon pitch; sub-nm order fluctuation control; super flattened mirror; super real projector; Costs; Diffraction; Displays; Fluctuations; Lithography; Mirrors; Optical devices; Reproducibility of results; Tensile stress; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics, 2009 IEEE/LEOS International Conference on
  • Conference_Location
    Clearwater, FL
  • Print_ISBN
    978-1-4244-2382-8
  • Electronic_ISBN
    978-1-4244-2382-8
  • Type

    conf

  • DOI
    10.1109/OMEMS.2009.5338603
  • Filename
    5338603