Title :
A scanning-light method for inspection of tool cutting edge
Author :
Shimizu, Yuki ; Jang, SungHo ; Asai, Takemi ; Ito, So ; Gao, Wei
Author_Institution :
Dept. of Nanomech., Tohoku Univ., Sendai, Japan
Abstract :
In this paper, a scanning-light method is proposed to evaluate the form of the tool cutting edge in a wide range up to several millimeters. An optical system, which consists of a photo diode, a laser diode unit and an objective lens, was developed. A small laser spot generated by the objective lens scans across the tool cutting edge, while monitoring the intensity of the laser beam passed through the tool cutting edge. In the proposed method, variation of the detected intensity is converted into information of the measured tool form. Feasibility of the proposed method was confirmed by simulations and experiments.
Keywords :
cutting tools; inspection; laser beam cutting; lenses; photodiodes; semiconductor lasers; intensity detection; laser beam intensity; laser diode unit; objective lens; optical system; photo diode; scanning-light method; tool cutting edge inspection; Diamond-like carbon; Image edge detection; Laser beam cutting; Laser beams; Measurement by laser beam; Measurement uncertainty; Semiconductor lasers; cutting tool; focused laser beam; measurement; micro-object; optical sensor; positioning;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
Print_ISBN :
978-1-4577-1773-4
DOI :
10.1109/I2MTC.2012.6229215