DocumentCode
247732
Title
An improved retinal modeling for illumination face recognition
Author
Yong Cheng ; Liangbao Jiao ; Zuoyong Li ; Xuehong Cao
Author_Institution
Sch. of Autom., Southeast Univ., Nanjing, China
fYear
2014
fDate
27-30 Oct. 2014
Firstpage
244
Lastpage
247
Abstract
Illumination variation is one of the most important challenges for robust face recognition system under real environment. It attracts more and more attention in face recognition field. In this paper, an improved retinal modeling is proposed to alleviate the adverse effect of lighting variation on face recognition. There are two main contributions. One is that it develops a new scheme to calculate appropriate adaptation factor through maximum filtering and illumination classification. The factor is quite crucial for illumination normalization by modeling the retinal information processing mechanism. The other is that an adaptive truncation based on the median statistics is used for contour enhancement. The proposed method can preserve image details, while achieves good illumination normalization results. Experimental results on the Extended Yale B face databases show that the new method achieves high recognition rates, and is quite effective in varying lighting condition, especially in difficult lighting situation.
Keywords
face recognition; filtering theory; image classification; image enhancement; lighting; median filters; retinal recognition; statistical analysis; adaptive truncation; adverse effect alleviation; contour enhancement; extended yale B face database; filtering; illumination classification; illumination face recognition system; illumination normalization; image preservation; improved retinal information processing mechanism; lighting variation; median statistics; Adaptation models; Equations; Face recognition; Lighting; Mathematical model; Retina; Training; Illumination normalization; adaptation factor; face recognition; retinal modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location
Paris
Type
conf
DOI
10.1109/ICIP.2014.7025048
Filename
7025048
Link To Document