• DocumentCode
    2479103
  • Title

    P3H-3 Thin Film Stack Transducer for Simultaneous Generation of Longitudinal and Shear Waves at Same Frequency

  • Author

    Yanagitani, Takahiko ; Matsuo, Takuya ; Matsukawa, Mami ; Watanabe, Yoshiaki

  • Author_Institution
    Tohoku Univ., Sendai
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    1874
  • Lastpage
    1877
  • Abstract
    It is difficult to generate longitudinal and shear bulk waves simultaneously at same frequency. In this study, we propose new film stack transducer structure consisting of two layers of c-axis 23deg-tilted ZnO films. The upper layer and lower layer in the stack have same thicknesses, and the c-axis tilt direction in the both layers are symmetric with respect to the film surface normal. This film stack transducers were fabricated on silica glass substrate by using RF magnetron sputtering technique. Crystallographic properties of the transducer were determined by XRD pole figure analysis. Detailed conversion loss characteristics of the transducer were also discussed. Simultaneous generation of both waves at same frequency was then experimentally demonstrated in the VHF range. We also included thin film fabrication technique for obtaining two layers of c-axis-tilted ZnO films with good crystalline orientation.
  • Keywords
    VHF devices; X-ray diffraction; bulk acoustic wave devices; silicon compounds; sputtering; thin film devices; ultrasonic transducers; zinc compounds; RF magnetron sputtering technique; VHF range; XRD pole figure analysis; ZnO; conversion loss characteristics; crystallographic properties; longitudinal waves; shear bulk waves; silica glass substrate; thin film stack transducer; ultrasonic transducer; zinc oxide films; Crystallography; Glass; Radio frequency; Silicon compounds; Sputtering; Substrates; Transducers; Transistors; X-ray scattering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.471
  • Filename
    4410044