• DocumentCode
    2479883
  • Title

    Distortion invariant optical pattern recognition

  • Author

    Gheen, Gregory

  • Author_Institution
    Lockheed Missiles & Space Co. Inc., Palo Alto, CA, USA
  • fYear
    1993
  • fDate
    15-18 Nov 1993
  • Firstpage
    51
  • Lastpage
    52
  • Abstract
    Pattern recognition involves assigning an unknown signal to a specific class. This is a difficult task because the set of signals associated with a class can vary widely in the Euclidean distance sense. For example, an image is effected by factors such as: perspective changes, lighting conditions, imaging environment (e.g. intervening clouds), and occlusions. All of these factors act in concert to generate a wide range of possible images for the same object. These variations are referred to as distortions. For simplicity, we will only discuss a two class pattern recognition problem, where a signal is classified as either target or clutter. The extension to multiclass problem is straight forward
  • Keywords
    clutter; image recognition; optical noise; Euclidean distance sense; clutter; distortion invariant optical pattern recognition; distortions; image; imaging environment; intervening clouds; lighting conditions; multiclass problem; occlusions; perspective changes; possible images; target; two class pattern recognition problem; unknown signal; Bayesian methods; Clouds; Euclidean distance; Missiles; Nearest neighbor searches; Optical distortion; Optical imaging; Optical sensors; Pattern recognition; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-1263-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1993.379135
  • Filename
    379135