• DocumentCode
    2480484
  • Title

    Automated mixed-signal SoC BIST synthesis utilizing hardware accelerators

  • Author

    George, Kiran ; Chen, Chien-In Henry

  • Author_Institution
    Comput. Eng. Program, California State Univ., Fullerton, CA, USA
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    1184
  • Lastpage
    1189
  • Abstract
    BIST techniques for analog and mixed-signal circuits have attracted considerable research activity; especially utilizing on-chip ROMs to store high precision sinusoidal stimuli and pre-calculated Delta-Sigma modulated bit-streams. However, usage of ROMs in high-performance circuits has poses substantial challenges, mainly because of its inability to run at-speed tests and high area overhead due to its prohibitively large size. An alternative to ROM utilization is the use of LFSRs. But, the computation time of the LFSR based BIST synthesis for large mixed-signal SoC poses a huge challenge. A high-performance computing (HPC) based automated mixed-signal SoC BIST synthesis technique that can outperform the conventional ROM implementation not only with respect to the computation time needed to generate the test vectors or waveforms, but also the BIST hardware required, is presented in this paper. Furthermore, the versatility of the presented LFSR based BIST test vector generator, that allows itself to be used for embedding deterministic patterns for LBIST and storing sinusoidal stimuli or pre-calculated Delta-Sigma modulated bit-stream for analog BIST, is demonstrated.
  • Keywords
    built-in self test; delta-sigma modulation; logic design; logic testing; shift registers; system-on-chip; BIST hardware; BIST test vector generator; HPC; LFSR; analog BIST; automated mixed-signal SoC BIST synthesis technique; hardware accelerators; high precision sinusoidal stimuli; high-performance circuits; high-performance computing; linear-feedback shift-register reseeding; mixed-signal circuits; on-chip ROM; precalculated delta-sigma modulated bit-stream; Built-in self-test; Graphics processing unit; Hardware; Instruction sets; Logic gates; Read only memory; System-on-a-chip; GPU; HPC; LBIST; ROM; mixed-signal BIST;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
  • Conference_Location
    Graz
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4577-1773-4
  • Type

    conf

  • DOI
    10.1109/I2MTC.2012.6229393
  • Filename
    6229393