DocumentCode
2480936
Title
Fault diagnosis approach based on probabilistic neural network and wavelet analysis
Author
Yang, Qing ; Gu, Lei ; Wang, Dazhi ; Wu, Dongsheng
Author_Institution
Sch. of Photo-Electron. Eng., Changchun Univ. of Sci. & Technol., Changchun
fYear
2008
fDate
25-27 June 2008
Firstpage
1796
Lastpage
1799
Abstract
A fault diagnosis method based on probabilistic neural network and Harr wavelet (HWPNN) to Tennessee Eastman (TE) process was presented. Noises and outliers in the data were firstly eliminated by Harr wavelet, and then the denoised data were used in probabilistic neural network to diagnose the faults. To validate the performance and effectiveness of the proposed scheme, the HWPNN was applied to diagnose the faults in TE process, and the classification accuracies of the classifiers were compared. The results showed that significant improvement in diagnosis accuracy was achieved by using HWPNN. HWPNN is better than PNN in classification ability and fault diagnosis accuracy.
Keywords
Haar transforms; chemical engineering computing; fault diagnosis; neural nets; pattern clustering; probability; wavelet transforms; Harr wavelet; Tennessee Eastman process; data denoising; fault diagnosis approach; probabilistic neural network; wavelet analysis; Fault detection; Fault diagnosis; Harmonic analysis; Information science; Intelligent control; Neural networks; Signal analysis; Tellurium; Wavelet analysis; Wavelet domain; TE process; fault diagnosis; probabilistic neural network; wavelet;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-2113-8
Electronic_ISBN
978-1-4244-2114-5
Type
conf
DOI
10.1109/WCICA.2008.4593194
Filename
4593194
Link To Document