• DocumentCode
    2480936
  • Title

    Fault diagnosis approach based on probabilistic neural network and wavelet analysis

  • Author

    Yang, Qing ; Gu, Lei ; Wang, Dazhi ; Wu, Dongsheng

  • Author_Institution
    Sch. of Photo-Electron. Eng., Changchun Univ. of Sci. & Technol., Changchun
  • fYear
    2008
  • fDate
    25-27 June 2008
  • Firstpage
    1796
  • Lastpage
    1799
  • Abstract
    A fault diagnosis method based on probabilistic neural network and Harr wavelet (HWPNN) to Tennessee Eastman (TE) process was presented. Noises and outliers in the data were firstly eliminated by Harr wavelet, and then the denoised data were used in probabilistic neural network to diagnose the faults. To validate the performance and effectiveness of the proposed scheme, the HWPNN was applied to diagnose the faults in TE process, and the classification accuracies of the classifiers were compared. The results showed that significant improvement in diagnosis accuracy was achieved by using HWPNN. HWPNN is better than PNN in classification ability and fault diagnosis accuracy.
  • Keywords
    Haar transforms; chemical engineering computing; fault diagnosis; neural nets; pattern clustering; probability; wavelet transforms; Harr wavelet; Tennessee Eastman process; data denoising; fault diagnosis approach; probabilistic neural network; wavelet analysis; Fault detection; Fault diagnosis; Harmonic analysis; Information science; Intelligent control; Neural networks; Signal analysis; Tellurium; Wavelet analysis; Wavelet domain; TE process; fault diagnosis; probabilistic neural network; wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-2113-8
  • Electronic_ISBN
    978-1-4244-2114-5
  • Type

    conf

  • DOI
    10.1109/WCICA.2008.4593194
  • Filename
    4593194