DocumentCode
2484131
Title
Measurement of complex permittivity of insulating materials for THz telecommunication modules
Author
Fukunaga, K. ; Mizuno, M. ; Tosaka, T. ; Fujii, K.
Author_Institution
Nat. Inst. of Inf. & Commun. Technol., Koganei, Japan
fYear
2012
fDate
14-17 Oct. 2012
Firstpage
448
Lastpage
450
Abstract
Measurement methods of complex permittivity of dielectric materials from 20 GHz to 3 THz are introduced. The dielectric properties of a liquid crystal polymer were not affected by environmental conditions, thus liquid crystal can become a candidate for insulating materials used in THz communications.
Keywords
dielectric materials; liquid crystals; microwave measurement; millimetre wave measurement; organic insulating materials; permittivity measurement; polymers; terahertz materials; THz telecommunication modules; complex permittivity measurement; dielectric materials; frequency 20 GHz to 3 THz; insulating materials; liquid crystal polymer; Communications technology; Dielectrics; Frequency measurement; Materials; Permittivity; Permittivity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
Conference_Location
Montreal, QC
ISSN
0084-9162
Print_ISBN
978-1-4673-1253-0
Electronic_ISBN
0084-9162
Type
conf
DOI
10.1109/CEIDP.2012.6378816
Filename
6378816
Link To Document