DocumentCode :
2484376
Title :
Towards a Theory of Sampled-Data Piecewise-Deterministic Markov Processes
Author :
Herencia-Zapana, Heber ; González, Oscar R. ; Gray, W. Steven
Author_Institution :
Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA
fYear :
2006
fDate :
13-15 Dec. 2006
Firstpage :
944
Lastpage :
949
Abstract :
The analysis and design of practical control systems requires that stochastic models be employed. Analysis and design tools have been developed, for example, for Markovian jump linear continuous and discrete-time systems, piecewise-deterministic processes (PDPs), and general stochastic hybrid systems (GSHSs). These model classes have been used in many applications, including fault tolerant control and networked control systems. This paper presents initial results on the analysis of a sampled-data PDP representation of a nonlinear sampled-data system with a jump linear controller. In particular, it is shown that the state of the sampled-data PDP satisfies the strong Markov property. In addition, a relation between the invariant measures of a sampled-data system driven by a stochastic process and its associated discrete-time representation are presented. As an application, when the plant is linear with no external input, a sufficient testable condition for the convergence in distribution to the invariant delta Dirac measure is given
Keywords :
Markov processes; continuous time systems; control system analysis; control system synthesis; discrete time systems; distributed control; fault tolerance; nonlinear control systems; sampled data systems; discrete-time systems; fault tolerant control; general stochastic hybrid systems; invariant delta Dirac measure; jump linear controller; networked control systems; nonlinear sampled-data system; piecewise-deterministic processes; sampled-data piecewise-deterministic Markov processes; stochastic models; stochastic process; Control system synthesis; Control systems; Convergence; Fault tolerant systems; Markov processes; Networked control systems; Nonlinear control systems; Stochastic processes; Stochastic systems; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 2006 45th IEEE Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0171-2
Type :
conf
DOI :
10.1109/CDC.2006.377266
Filename :
4178061
Link To Document :
بازگشت