DocumentCode :
2486896
Title :
Measurement of RF current waveform of a source driver chip used in a liquid crystal-TV display panel
Author :
Kobayashi, Shoichi ; Torizuka, Hideki ; Dhungana, Sandeep ; Yamaguchi, Masahiro
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
505
Lastpage :
508
Abstract :
Instantaneous RF current waveform of the power line for a source driver chip used in a typical colour active matrix type liquid crystal-TV display panel has been evaluated for the first time based on magnetic near field measurement. A 16-inch panel set was opened to bare the 10 parallelly-connected source driver chips. Each chip is with 2.7 mm × 12.0 mm in size, and drives 207 liquid crystal cells with nominally 100 pF for each at 16 Vmax with common voltage level of 8 V, which corresponds to the maximum charge of 0.17 μC. A shielded-loop probe (CP-2S, window size: 0.2 mm × 1.0 mm) was used to measure the induced voltage waveform. The analogue power line was identified as the major source of RF magnetic field noise. Then RF current waveform was calculated based on the Faraday´s low, using the size and geometry of measurement system. It is known the cells are fully charged when all the panel cells display “white.” The measured corresponding peak current was 130 mA with rise time of less than 10 ns at the turned-off of clock pulse, followed by a triangular-like decrease for 1.7 μs. The corresponding electric charge was 0.14 μC, which is closely to the maximum possible charge of 0.17 μC. The spectrum of RF current has significant intensity even around 1 GHz.
Keywords :
driver circuits; electric current measurement; electromagnetic interference; liquid crystal displays; television displays; RF current waveform measurement; TV display panel; analogue power line; liquid crystal cells; liquid crystal display panel; panel cells display; source driver chip; Current measurement; Driver circuits; Magnetic field measurement; Probes; Radio frequency; Time measurement; Voltage measurement; EMC; LCD panel; RF current waveform; magnetic near- field measurement Faraday´s low; shielded loop probe;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
ISSN :
2158-110X
Print_ISBN :
978-1-4244-6305-3
Type :
conf
DOI :
10.1109/ISEMC.2010.5711327
Filename :
5711327
Link To Document :
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