• DocumentCode
    2488166
  • Title

    Current testing procedure for deep submicron devices

  • Author

    Chichkov, Anton ; Merlier, Dirk ; Cox, Peter

  • Author_Institution
    Alcatel Microelectron., Oudenaarde, Belgium
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    91
  • Lastpage
    96
  • Abstract
    This paper presents a test technique that employs two different supply voltages for the same IDDQ pattern. The results of the two measurements are subtracted in order to eliminate the inherent subthreshold leakage. Summary of the experiment carried out on a “System on a Chip” (SOC) device build in 0.35 μm technology is also shown. The experiments proved that the method is effective in detecting failures not detectable with the single limit I DDQ
  • Keywords
    automatic testing; electric current measurement; fault diagnosis; integrated circuit testing; leakage currents; IDDQ pattern; SoC device; cumulative probability distribution; current testing procedure; deep submicron devices; different supply voltages; differential current measurement; subthreshold leakage elimination; CMOS technology; Circuit faults; Circuit testing; Current measurement; Failure analysis; Integrated circuit testing; Leakage current; Microelectronics; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop, 2000. Proceedings. IEEE European
  • Conference_Location
    Cascais
  • ISSN
    1530-1877
  • Print_ISBN
    0-7695-0701-8
  • Type

    conf

  • DOI
    10.1109/ETW.2000.873784
  • Filename
    873784
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2488166