Title :
Measuring skin reflectance parameters
Author :
Dickens, P. ; Smith, W.A.P. ; Ragheb, H. ; Hancock, E.R.
Author_Institution :
Univ. of York, York
Abstract :
This paper addresses the problem of determining skin reflectance parameters, and studies their stability and discriminating power for different individuals. Our study uses radiance data captured by a Cyberware 3030 range scanner. We analyse the data using a layered reflectance model based on the Beckmann-Kirchhoff wave scattering model. The parameters of this model are the thickness of the skin layers, and their roughness. We investigate how the parameters of this model vary between different subjects, and how they vary for the same subject under different conditions.
Keywords :
face recognition; image scanners; Beckmann-Kirchhoff wave scattering model; Cyberware 3030 range scanner; reflectance model; skin layers; skin reflectance parameters; Brain modeling; Humans; Light scattering; Optical scattering; Particle scattering; Reflectivity; Rough surfaces; Scattering parameters; Skin; Surface roughness;
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
DOI :
10.1109/ICPR.2008.4761885