• DocumentCode
    2490875
  • Title

    Measuring skin reflectance parameters

  • Author

    Dickens, P. ; Smith, W.A.P. ; Ragheb, H. ; Hancock, E.R.

  • Author_Institution
    Univ. of York, York
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper addresses the problem of determining skin reflectance parameters, and studies their stability and discriminating power for different individuals. Our study uses radiance data captured by a Cyberware 3030 range scanner. We analyse the data using a layered reflectance model based on the Beckmann-Kirchhoff wave scattering model. The parameters of this model are the thickness of the skin layers, and their roughness. We investigate how the parameters of this model vary between different subjects, and how they vary for the same subject under different conditions.
  • Keywords
    face recognition; image scanners; Beckmann-Kirchhoff wave scattering model; Cyberware 3030 range scanner; reflectance model; skin layers; skin reflectance parameters; Brain modeling; Humans; Light scattering; Optical scattering; Particle scattering; Reflectivity; Rough surfaces; Scattering parameters; Skin; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-2174-9
  • Electronic_ISBN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2008.4761885
  • Filename
    4761885