DocumentCode :
2490875
Title :
Measuring skin reflectance parameters
Author :
Dickens, P. ; Smith, W.A.P. ; Ragheb, H. ; Hancock, E.R.
Author_Institution :
Univ. of York, York
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
This paper addresses the problem of determining skin reflectance parameters, and studies their stability and discriminating power for different individuals. Our study uses radiance data captured by a Cyberware 3030 range scanner. We analyse the data using a layered reflectance model based on the Beckmann-Kirchhoff wave scattering model. The parameters of this model are the thickness of the skin layers, and their roughness. We investigate how the parameters of this model vary between different subjects, and how they vary for the same subject under different conditions.
Keywords :
face recognition; image scanners; Beckmann-Kirchhoff wave scattering model; Cyberware 3030 range scanner; reflectance model; skin layers; skin reflectance parameters; Brain modeling; Humans; Light scattering; Optical scattering; Particle scattering; Reflectivity; Rough surfaces; Scattering parameters; Skin; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
ISSN :
1051-4651
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2008.4761885
Filename :
4761885
Link To Document :
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