Study of multiple layer dielectric loaded elliptical ridge waveguide by edge finite element method

Author

Li, Guojian ; Ma, Aning ; Cheng, Yinqin

Author_Institution

Sch. of Electr. Eng., Northwest Univ. for Nat., Lanzhou, China

Volume

3

fYear

2012

fDate

5-8 May 2012

Firstpage

1

Lastpage

3

Abstract

A new kind of multiple layer dielectric loaded elliptical ridge waveguide is presented in this paper. Variations of the cutoff wavelength and single-mode bandwidth with the ridge dimensions for different values of dielectric constant have been investigated in detail by using edge element method. The field patterns of the waveguide also have been presented. The results will be of practical significance in designing ridge waveguide components in microwave and millimeter wave engineering.

Keywords

dielectric-loaded waveguides; finite element analysis; permittivity; ridge waveguides; cutoff wavelength; dielectric constant; edge finite element method; field patterns; microwave engineering; millimeter wave engineering; multiple layer dielectric loaded elliptical ridge waveguide; ridge dimensions; ridge waveguide component design; single-mode bandwidth; Bandwidth; Dielectrics; Finite element methods; Loaded waveguides; Optical waveguides; Rectangular waveguides;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology (ICMMT), 2012 International Conference on

Conference_Location

Shenzhen

Print_ISBN

978-1-4673-2184-6

Type

conf

DOI

10.1109/ICMMT.2012.6230133

Filename

6230133